Publicación:
"Methodology for the Analysis of Materials, based on the Analysis of Phantoms by Means of X-rays"

dc.contributor.author"Urbano, Kitty
dc.contributor.authorAuccahuasi, Wilver
dc.contributor.authorMeza, Sandra
dc.contributor.authorFlores-Castameda, Rosalynn Ornella
dc.contributor.authorCosme, Miryam
dc.contributor.authorCastro, Percy"
dc.date.accessioned2026-10-09T04:44:36Z
dc.date.issued2025
dc.description.abstract"The materials that make up the different devices and components used in the area of aviation, are exposed to stress caused by the same work to which it is subjected, the procedures and protocols for evaluation of equipment and aviation materials, are indicated that these periodic evaluations, according to the number of flight hours, in order to demonstrate the wear of the material and recommend their change. In the present work we indicate a methodology to be able to analyze the different components based on the material they are composed of, we present a practical way to be able to evaluate the behavior of the material through the use of phantoms to work with X-ray images, using the techniques provided by the non-destructive tests. The results show that the method can be used as an analysis pattern, having to generate a phantom as an image pattern, for each of the equipment and materials to be evaluated, as a conclusion we indicate that using comparison phantoms allows a better analysis as well as allows to develop in future work algorithms that can be developed in order to perform these processes in an automatic way, and that can be used for the evaluation of the materials to be evaluated. © 2025 IEEE."
dc.identifier.doi10.1109/ICSCSA66339.2025.11171328
dc.identifier.scopus2-s2.0-105018459297
dc.identifier.urihttp://hdl.handle.net/20.500.14929/1130
dc.identifier.uuid9f63f96b-b251-4978-9c71-119987b26ad4
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers Inc.
dc.relation.ispartof"Proceedings of 5th International Conference on Soft Computing for Security Applications, ICSCSA 2025"
dc.rightshttp://purl.org/coar/access_right/c_16ec
dc.subjectanalysis
dc.subjectimaging
dc.subjectmethodology
dc.subjectPhantom
dc.subjectX-ray
dc.subject.ocdehttps://purl.org/pe-repo/ocde/ford#2.05.00
dc.subject.ods"ODS 9: Industria, innovación e infraestructura"
dc.title"Methodology for the Analysis of Materials, based on the Analysis of Phantoms by Means of X-rays"
dc.typehttp://purl.org/coar/resource_type/c_5794
dspace.entity.typePublication
oaire.citation.endPage2128
oaire.citation.startPage2125

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